The Investigation of Reliability for N-Channel FinFET in Positive Bias Temperature Instability and Hot-Carrier Stress

The Investigation of Reliability for N-Channel FinFET in Positive Bias Temperature Instability and Hot-Carrier Stress

碩士 === 國立高雄大學 === 電機工程學系碩士班 === 102 === 紙本專利開放日106.07.30

Bibliographic Details
Main Authors: Jie-Chen Wong, 翁介晨
Other Authors: Wen-Kuan Yeh
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/76898286751144216583
id ndltd-TW-102NUK05442036
record_format oai_dc
spelling ndltd-TW-102NUK054420362016-05-22T04:40:27Z http://ndltd.ncl.edu.tw/handle/76898286751144216583 The Investigation of Reliability for N-Channel FinFET in Positive Bias Temperature Instability and Hot-Carrier Stress 正偏壓不穩定效應及熱載子效應對N型鰭化式場效電晶體之可靠度研究 Jie-Chen Wong 翁介晨 碩士 國立高雄大學 電機工程學系碩士班 102 紙本專利開放日106.07.30 Wen-Kuan Yeh 葉文冠 2014 學位論文 ; thesis 62 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立高雄大學 === 電機工程學系碩士班 === 102 === 紙本專利開放日106.07.30
author2 Wen-Kuan Yeh
author_facet Wen-Kuan Yeh
Jie-Chen Wong
翁介晨
author Jie-Chen Wong
翁介晨
spellingShingle Jie-Chen Wong
翁介晨
The Investigation of Reliability for N-Channel FinFET in Positive Bias Temperature Instability and Hot-Carrier Stress
author_sort Jie-Chen Wong
title The Investigation of Reliability for N-Channel FinFET in Positive Bias Temperature Instability and Hot-Carrier Stress
title_short The Investigation of Reliability for N-Channel FinFET in Positive Bias Temperature Instability and Hot-Carrier Stress
title_full The Investigation of Reliability for N-Channel FinFET in Positive Bias Temperature Instability and Hot-Carrier Stress
title_fullStr The Investigation of Reliability for N-Channel FinFET in Positive Bias Temperature Instability and Hot-Carrier Stress
title_full_unstemmed The Investigation of Reliability for N-Channel FinFET in Positive Bias Temperature Instability and Hot-Carrier Stress
title_sort investigation of reliability for n-channel finfet in positive bias temperature instability and hot-carrier stress
publishDate 2014
url http://ndltd.ncl.edu.tw/handle/76898286751144216583
work_keys_str_mv AT jiechenwong theinvestigationofreliabilityfornchannelfinfetinpositivebiastemperatureinstabilityandhotcarrierstress
AT wēngjièchén theinvestigationofreliabilityfornchannelfinfetinpositivebiastemperatureinstabilityandhotcarrierstress
AT jiechenwong zhèngpiānyābùwěndìngxiàoyīngjírèzàizixiàoyīngduìnxíngqíhuàshìchǎngxiàodiànjīngtǐzhīkěkàodùyánjiū
AT wēngjièchén zhèngpiānyābùwěndìngxiàoyīngjírèzàizixiàoyīngduìnxíngqíhuàshìchǎngxiàodiànjīngtǐzhīkěkàodùyánjiū
AT jiechenwong investigationofreliabilityfornchannelfinfetinpositivebiastemperatureinstabilityandhotcarrierstress
AT wēngjièchén investigationofreliabilityfornchannelfinfetinpositivebiastemperatureinstabilityandhotcarrierstress
_version_ 1718275905535606784

Similar Items