Analysis on Effective Lifetime Index of Polishing Pad for CMP Process of Monocrystalline Silicon Wafers and Sapphire

碩士 === 國立臺灣科技大學 === 機械工程系 === 102 === Since ancient times, polishing has been a process critical to bronze mirrors, jade and jewelry grinding until modern wafer planarization in semiconductor industry’s. However, mechanical polishing has certain limitation, the chemical mechanical planarization (CMP...

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Bibliographic Details
Main Authors: Chan-Ju Wen, 溫禪儒
Other Authors: Chao-Chang Chen
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/32497829840515040968