Observation of Internal Light Intensity Distribution of Light Emitting Diodes Grown on Patterned Sapphire Substrate by Optical Microscopy

碩士 === 國立臺灣科技大學 === 電子工程系 === 102 === In general, the light emitting diodes (LEDs) are discussed its luminous quality by the variation of external light of LED. We use optical microscopy in combination of high magnification objective lens and mobile platform, We could focus on the surface and latera...

Full description

Bibliographic Details
Main Authors: CHUNG-HAO LEE, 李中皓
Other Authors: Jung-Chieh Su
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/83264250963170104089

Similar Items