Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM Tip

Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM Tip

博士 === 國立清華大學 === 奈米工程與微系統研究所 === 102 === 申請專利中，論文延後公開

Bibliographic Details
Main Authors:	Chang, Joe-Ming, 張佐民
Other Authors:	Tseng, Fan-Gang
Format:	Others
Language:	en_US
Published:	2014
Online Access:	http://ndltd.ncl.edu.tw/handle/45132978824856792269

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