Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM Tip

博士 === 國立清華大學 === 奈米工程與微系統研究所 === 102 === 申請專利中，論文延後公開

Bibliographic Details
Main Authors:	Chang, Joe-Ming, 張佐民
Other Authors:	Tseng, Fan-Gang
Format:	Others
Language:	en_US
Published:	2014
Online Access:	http://ndltd.ncl.edu.tw/handle/45132978824856792269

id	ndltd-TW-102NTHU5795003
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spelling	ndltd-TW-102NTHU57950032016-03-14T04:13:23Z http://ndltd.ncl.edu.tw/handle/45132978824856792269 Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM Tip 以接合單一顆儲電之鐵氟龍奈米球的掃瞄探針進行電場量測 Chang, Joe-Ming 張佐民博士國立清華大學奈米工程與微系統研究所 102 申請專利中，論文延後公開 Tseng, Fan-Gang Chieng, Chin-Chang 曾繁根錢景常 2014 學位論文 ; thesis 75 en_US
collection	NDLTD
language	en_US
format	Others
sources	NDLTD
description	博士 === 國立清華大學 === 奈米工程與微系統研究所 === 102 === 申請專利中，論文延後公開
author2	Tseng, Fan-Gang
author_facet	Tseng, Fan-Gang Chang, Joe-Ming 張佐民
author	Chang, Joe-Ming 張佐民
spellingShingle	Chang, Joe-Ming 張佐民 Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM Tip
author_sort	Chang, Joe-Ming
title	Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM Tip
title_short	Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM Tip
title_full	Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM Tip
title_fullStr	Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM Tip
title_full_unstemmed	Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM Tip
title_sort	direct measurement of electrostatic fields using single teflon nanoparticle attached to afm tip
publishDate	2014
url	http://ndltd.ncl.edu.tw/handle/45132978824856792269
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Direct measurement of electrostatic fields using single Teflon nanoparticle attached to AFM Tip

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