Measurement and Characterization of Tip Tunneling Diode

碩士 === 國立清華大學 === 電子工程研究所 === 102 === This work presents a tip tunneling diode by 0.18µm embedded flash process. The tip structure is employed to create electrical field enhancement effect, resulting in current difference between forward and reverse bias. Thorough, measurement and simulation of the...

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Bibliographic Details
Main Authors: Gu, Min-Siang, 辜民翔
Other Authors: King, Ya-Chin
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/75598703757982703713

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