Measurement and Characterization of Tip Tunneling Diode
碩士 === 國立清華大學 === 電子工程研究所 === 102 === This work presents a tip tunneling diode by 0.18µm embedded flash process. The tip structure is employed to create electrical field enhancement effect, resulting in current difference between forward and reverse bias. Thorough, measurement and simulation of the...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2014
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Online Access: | http://ndltd.ncl.edu.tw/handle/75598703757982703713 |