QRC-CABC： A Yield-aware Placement with Queen Ratio Cutting for the Capacitor Array Block Creator
碩士 === 國立中央大學 === 電機工程學系 === 102 === As the advancement of semiconductor process technology, the process variation will be more and more serious in device mismatch for the analog integrated circuits. There are several placement algorithms presented to improve the capacitance ratio matching due to sp...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/85819308193695702044 |