Experimental demonstration of SiGe Nanopillars

碩士 === 國立中央大學 === 電機工程學系 === 102 === With the rapid miniaturization of electric devices to boost the switching speed and to increase the number of components per integrated circuit (IC) chip, performance and reliability of devices are severely threatened by localized hot spots where the temperature...

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Bibliographic Details
Main Authors: Keng-Yu Lin, 林庚諭
Other Authors: 李佩雯
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/30055196515608910160