| Summary: | 碩士 === 國立交通大學 === 電機學院電機與控制學程 === 102 === In radio frequency identification (RFID) field, it’s a tough problem to generate a unique ID which is hard to be cracked. Traditionally, the delivered message is protected and encrypted by key-cryptography to make sure it cannot be cracked easily. However, there is security vulnerability that the attacker can obtain IDs or counterfeit tags easily to infringe the right of privacy by any means of attacks. It threatens largely not only personal information but also property safety.
Physical Unclonable function (PUF) is specific physical structure function. It’s one of the novel techniques of identity authentication. Each chip has own DNA serial digits which is defined by the different physical characteristics due to the limited drift during the manufacture of silicon wafer. The digits generated by PUF technique was applied on RFID system, this method avoids the tag being stolen, tampered and counterfeited by attacker. Silicon devices are sensitive to environment, the variations of temperature and operating voltage would change the characteristics of PUF and generate incorrect digits, these result in the identification failure.
In this thesis, the ECC was used to repair the error bits caused by the variations of temperature and operating voltage. ECC engine makes RFID tag can deliver correct information to the reader and increase the identification reliability for the PUF being used in RFID system. Meanwhile, a novel PUF architecture was proposed, it utilizes the drift of semiconductor process to have different characteristics of interconnects and devices and diverse timing performance in each chip. The proposed PUF circuit counts the delay variation to generate digits; the ECC engine processes the digits with the calculated parity to fix the erroneous bits. This method reduces the package error rate to the delivered message and increases the system reliability.
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