Developmant and demostration of microscope

• Main Authors: Lee, Chung-Hsing, 李重興
• Other Authors: Jian, Wen-Bin
• Format: Others
• Language: zh-TW
• Published: 2014
• Online Access: http://ndltd.ncl.edu.tw/handle/q246ed

碩士 === 國立交通大學 === 電子物理系所 === 102 === We developed a portable scanning tunneling microscope (STM) equipped with a stepper. The tip can automatically approach the sample surface and the microscope can describe the morphology of nanomaterials with a high spatial resolution in ambient conditions. In this work, we improved the STM to be operated under different environments and we developed several new functions to detect characteristics of samples. We designed a liquid cell and fabricated a tip coated with a thin insulator so we could scan images in liquid. Further, the lithography function is introduced by applying high voltage pulses, thus we can deposit nanostructures on sample surfaces. Moreover, we developed an additional function of scanning tunneling spectroscopy. To enlarge the scanning area, we designed a new scanner which is driven by 10 volt. The scanning range of the scanner is up to 15 micrometers which is 4 times larger in comparison with previous designs, while maintaining the same spatial resolution. On the other hand, we developed a TEM simulator. We use the laser to simulate the electron beam of TEM. We can obtain real diffraction images of crystalline samples. The simulator can demonstrate the operation mechanism of a TEM machine.