| Summary: | 碩士 === 國立交通大學 === 照明與能源光電研究所 === 102 === From then till now, people never stop exploring tiny things. According to the classification of microscope, the purpose of microscopes are not only limited in observation but also used in detection and analysis. In recent years, with the progress of three dimension visualization, researchers pay more attention on how to combine the three dimensional information with microscopy to render high resolution three dimensional model. Both conventional optical and electron microscopy are no longer useful. Although confocal microscope can form three dimensional models by scanning the object, it is no debut a mechanical method. Furthermore, traditional light field microscope can reconstruct perspective view due to more angle information, the resolution is limited.
In this thesis, a new integral image microscope system with LC devices was proposed. We introduced an axial scanning system by using electric controlled LC lens with afocal relay lens so that the three dimensional model can be formed by applied different operating voltage. We also designed LC plates to place in light field system. The resolution of integral image microscope can be improved by combining images with displacement. Moreover, by using LC material, we can easily make a new device which combines LC lens and LC plate, so the space can be reduce. Finally, we can perform an improving captured resolution of integral image microscope.
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