A Wafer Start Policy By Loading Of Bottleneck Machine For Semiconductor Fabrication
碩士 === 國立交通大學 === 管理學院工業工程與管理學程 === 102 === This research studies the daily job release policy for a semiconductor wafer fab, operating in a scenario which involves both MTO (make-to-order) and MTS (make-to-stock) orders. The objective of the job release policy is to minimize the work-in-process (WI...
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2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/78152964503140949572 |
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ndltd-TW-102NCTU50310582016-07-02T04:21:06Z http://ndltd.ncl.edu.tw/handle/78152964503140949572 A Wafer Start Policy By Loading Of Bottleneck Machine For Semiconductor Fabrication 以瓶頸機台負荷評估晶圓廠投料決策 Wu, Mei-Hui 吳玫慧 碩士 國立交通大學 管理學院工業工程與管理學程 102 This research studies the daily job release policy for a semiconductor wafer fab, operating in a scenario which involves both MTO (make-to-order) and MTS (make-to-stock) orders. The objective of the job release policy is to minimize the work-in-process (WIP) deviation of the bottleneck workstation, in order to reduce the deviation of cycle time. Four heuristic methods (M-1, M-2, M-3, and M-4) are developed in this study and justified by a simulation program coded in Flexsim (proprietary discrete event simulation software). Simulation results indicate that method M-1, by the ANOVA test, significantly outperforms the other three ones. Wu, Muh-Cherng 巫木誠 2014 學位論文 ; thesis 32 zh-TW |
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NDLTD |
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zh-TW |
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Others
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NDLTD |
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碩士 === 國立交通大學 === 管理學院工業工程與管理學程 === 102 === This research studies the daily job release policy for a semiconductor wafer fab, operating in a scenario which involves both MTO (make-to-order) and MTS (make-to-stock) orders. The objective of the job release policy is to minimize the work-in-process (WIP) deviation of the bottleneck workstation, in order to reduce the deviation of cycle time. Four heuristic methods (M-1, M-2, M-3, and M-4) are developed in this study and justified by a simulation program coded in Flexsim (proprietary discrete event simulation software). Simulation results indicate that method M-1, by the ANOVA test, significantly outperforms the other three ones.
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| author2 |
Wu, Muh-Cherng |
| author_facet |
Wu, Muh-Cherng Wu, Mei-Hui 吳玫慧 |
| author |
Wu, Mei-Hui 吳玫慧 |
| spellingShingle |
Wu, Mei-Hui 吳玫慧 A Wafer Start Policy By Loading Of Bottleneck Machine For Semiconductor Fabrication |
| author_sort |
Wu, Mei-Hui |
| title |
A Wafer Start Policy By Loading Of Bottleneck Machine For Semiconductor Fabrication |
| title_short |
A Wafer Start Policy By Loading Of Bottleneck Machine For Semiconductor Fabrication |
| title_full |
A Wafer Start Policy By Loading Of Bottleneck Machine For Semiconductor Fabrication |
| title_fullStr |
A Wafer Start Policy By Loading Of Bottleneck Machine For Semiconductor Fabrication |
| title_full_unstemmed |
A Wafer Start Policy By Loading Of Bottleneck Machine For Semiconductor Fabrication |
| title_sort |
wafer start policy by loading of bottleneck machine for semiconductor fabrication |
| publishDate |
2014 |
| url |
http://ndltd.ncl.edu.tw/handle/78152964503140949572 |
| work_keys_str_mv |
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