Application of Building Information Modeling in Quantity Take-offs for Semiconductor Fab Facility Systems
碩士 === 國立交通大學 === 工學院工程技術與管理學程 === 102 === Quantity take-off is a time-consuming and error-prone step in the cost estimating process. By introducing the building information modeling (BIM) can effectively improve the timeliness and quantity take-off accuracy, but the practice now is limited to bu...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/27580143455907688264 |