| Summary: | 碩士 === 國立交通大學 === 工學院工程技術與管理學程 === 102 === Quantity take-off is a time-consuming and error-prone step in the cost estimating process. By introducing the building information modeling (BIM) can effectively improve the timeliness and quantity take-off accuracy, but the practice now is limited to building related fields. To construct a semiconductor Fab need huge amount investment, of which (excluding process tools) over 60% were contributed by facility system installation. It highlights the importance of the facility systems and that would get more benefit if we can utilize BIM in this portion. However, the composition of facility systems in a semiconductor Fab is complex and professional, it create the barrier to build their BIM models. Therefore, via a real case of semiconductor fab with 2 selected facility systems, this study is going to explore how to build a model of facility systems BIM and how about the accuracy when applying this BIM for quantity take-off?
Selecting the appropriate BIM tool is the first step and creating 3D objects database is the foundation of a model building process for semiconductor Fab BIM. in addition to describes the detailed steps of process, this study also provide a systematic methodology basing on Fab owner’s view point for key decision making, and the result shows the compatibility to our study case. Finally, In the object quantity take-off portion, a list of the objects (Bill of Material) generated by BIM model will be compared with the output of manual calculation provided by system vendor. Although the preliminary results show that there are some differences, through the analyzing, the variance can be greatly reduced by taking following approaches: 1. to identify the purpose and level of detail (LOD) of BIM modeling in the initial. 2. To communicate with vendors regarding the system quantitative guideline. With the accuracy enhanced, the Quantity take-off result generated by BIM can then help Fab owner improving their capability of cost control in facility systems.
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