Analysis of Water Vapor and Saline Environment Reliability Degradation Mechanisms in InGaN/GaN LEDs by Reverse-Bias Stress

碩士 === 國立暨南國際大學 === 應用材料及光電工程學系 === 102 === In this thesis, we present a technique to quickly investigate the lifetime and reliability of light emitting diode by using the reverse-bias stress, and the devices were operated in dry air, water vapor and salty water condition. The current-voltage (I-V)...

Full description

Bibliographic Details
Main Authors: Yu-Cheng Chu, 朱育澄
Other Authors: Hsiang Chen
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/yt8g85

Similar Items