Analysis of Water Vapor and Saline Environment Reliability Degradation Mechanisms in InGaN/GaN LEDs by Reverse-Bias Stress
碩士 === 國立暨南國際大學 === 應用材料及光電工程學系 === 102 === In this thesis, we present a technique to quickly investigate the lifetime and reliability of light emitting diode by using the reverse-bias stress, and the devices were operated in dry air, water vapor and salty water condition. The current-voltage (I-V)...
Main Authors: | Yu-Cheng Chu, 朱育澄 |
---|---|
Other Authors: | Hsiang Chen |
Format: | Others |
Language: | zh-TW |
Published: |
2014
|
Online Access: | http://ndltd.ncl.edu.tw/handle/yt8g85 |
Similar Items
-
Degradation of InGaN/GaN Light-Emitting Diode Submitted to Forward-bias and Reverse-bias Stress in Salty Water Vapor Ambient
by: Li-Chen Chu, et al.
Published: (2015) -
Analysis of the InGaN ∕ GaN LED With an InGaN ∕ GaN pre-buffer layer
by: Po-Yi Hou, et al.
Published: (2008) -
Optoelectronic study of InGaN/GaN LEDs
by: Wallace, Michael
Published: (2016) -
The electrical properties of InGaN/GaN MQWs LED
by: Kuo-Uei Tseng, et al.
Published: (2002) -
Fabrication and Characteristics of Micron-Size InGaN/GaN LEDs
by: Jin-Fu Hsu, et al.
Published: (2005)