Effects of Device Dimension on Characteristics and Reliability of Peripheral Devices in NAND Flash Memory
碩士 === 國立成功大學 === 微電子工程研究所 === 102 === Recent years, NAND flash memory device which has been widely applied to 3C mobile products is suitable for mass storage devices because of high storage density, high access speed, and low unit cost. The main purpose of this thesis is about reliability and per...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/47628294475599989959 |