| Summary: | 碩士 === 國立勤益科技大學 === 資訊工程系 === 102 === Nowadays, touch-control environment has become the most popular equipment in the mobile-communication devices. The development and the manufacturing of such components from various providers have advantages and innovations of their own. However, a short circuit happens very often during the layout phase of designing and developing the touch panel (TP) module on the Indium Tin Oxide (ITO) board. With the existing testing methods, they cost and waste a lot ofresources, that is because Driver ICs have already been mounting on to the Flexible Print Circuit (FPC) during the testing phase of TP. Because of this, when computer application finally detects that a ITO short circuit is caused by the ITO circuit board layout short circuit, it needs to be re-mounted, or worse, it goes to waste. As a result, a lot of time and resources go to waste during production of touch control components.
This thesis aims to research on improving the above mentioned situation. One solution is to test and detect bad quality product before driver ICs and components got mounted onto FPC board. Therefore, we designed a way to test a short circuit on the ITO board at the beginning using a comparator circuit, in order to discover bad quality TP. By doing that, the production costs reduced visibly, the quality increases and the production time has shorten. To prove our concept,we have built a prototype, which has proved that it can detect bad quality production efficiently as early as possible; moreover, it can be reused to discover if a short circuit is to happen.
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