Structural and Optical Characterization of GaN deposited on (111) Si using Er2O3/Gd2O3 buffer layer

Structural and Optical Characterization of GaN deposited on (111) Si using Er2O3/Gd2O3 buffer layer

碩士 === 國立中興大學 === 物理學系所 === 102 === The structural and optical characteristics of GaN film deposited on Er2O3/Gd2O3-coated (111) Si were studied using double-crystal x-ray rocking curve (DCXRC), high resolution transmission electron microscopy (HRTEM) and photoluminescence (PL) spectroscopy in this...

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Bibliographic Details
Main Authors:	Ko-Ying Lo, 羅可瑩
Other Authors:	Jyh-Rong Gong
Format:	Others
Language:	en_US
Published:	2014
Online Access:	http://ndltd.ncl.edu.tw/handle/67795984819949776895

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