Design for testability to digitize capacitor and resistor mismatch of analog circuit
碩士 === 國立高雄應用科技大學 === 電子工程系碩士班 === 102 === Recently, the System-on-Chip (SoC) are more interests in integrated circuit by researchers owing to the rapid development of integrated circuit manufacturing technology. The testing of integrated circuit is more difficult than before, and the cost of reliab...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/zu956q |