ESD Test and Simulation Analysis with Protection Techniques for IC on board

碩士 === 逢甲大學 === 通訊工程學系 === 102 === In recent years, the integrated circuit (IC) is development, production process quick size evolution, elements reduced to deep submicron stage to promote integrated circuit (IC) performance and computing speed, making ESD (Electrostatic Discharge) protection capabi...

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Bibliographic Details
Main Authors: Yi-Chen Chou, 周易澄
Other Authors: 林漢年
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/41086123635446035927