Characterization of electron trap energy spectrum in single-ended non-overlapped implantation devices
碩士 === 中原大學 === 電子工程研究所 === 102 === In the semiconductor industry, non-volatile memory (NVM) applications are extensive, and the relative markets have been well developed. For developing semiconductor NVM devices, the effect and improvement of reliability characteristics play important roles. This w...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2014
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/ne6tp4 |