Improvements of Plasma Cleaning and Scrub Mode on the 2nd Bond in Cu Wire-bonding Process

碩士 === 建國科技大學 === 電子工程系暨研究所 === 102 === In this thesis, we are focusing on the strength between copper wire and silver plating layer which are affected by the setting of the scrub on/off mode in 2nd bond process and the plasma cleaning. Also, other required bonding process qualities are being analyz...

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Bibliographic Details
Main Authors: Kuo-Chuan Lee, 李國全
Other Authors: Huei-Tzong Lu
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/04759639983526912095