The Study Of Electroplated Copper Film Uniformity Improvement On A Silicon Wafers

碩士 === 正修科技大學 === 電機工程研究所 === 102 === In this study, we discussed operating conditions and plating tank design affecting for copper plating.Using Optical microscope analysis and observation.We adjust the current and design working electrode. This study found that by changing the design and flow of...

Full description

Bibliographic Details
Main Authors: Feng,Jian-Bin, 馮建斌
Other Authors: Huang,Chun-Chieh
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/34396860874432622255