Current-Induced Magnetization Switching in Perpendicularly Anisotropy MagnetizedMgO/CoFeB/Ta

碩士 === 國立中正大學 === 物理學系暨研究所 === 102 === The current-induced switching (CIS) in perpendicular magnetic thin layers and tunnel junctions has recently attracted lots of attention due to the possibility to achieve higher density magnetic random access magnetic memory(MRAM). However, the mechanism of the...

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Main Authors: Tzeng Wei Han, 曾威翰
Other Authors: Chern Gung
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/72521932516986474780
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spelling ndltd-TW-102CCU001980112015-10-13T23:37:37Z http://ndltd.ncl.edu.tw/handle/72521932516986474780 Current-Induced Magnetization Switching in Perpendicularly Anisotropy MagnetizedMgO/CoFeB/Ta 垂直式MgO/CoFeB/Ta 結構中電流驅動的磁滯翻轉 Tzeng Wei Han 曾威翰 碩士 國立中正大學 物理學系暨研究所 102 The current-induced switching (CIS) in perpendicular magnetic thin layers and tunnel junctions has recently attracted lots of attention due to the possibility to achieve higher density magnetic random access magnetic memory(MRAM). However, the mechanism of the CIS and the materials dependence is still not clear. In this thesis, we fabricated a series of perpendicular magnetized MgO/CoFeB(1.3 nm)/Ta Hall bar structures with Ta thickness = 1, 1.25, and 5 nm, respectively. We found that the magnetic switching, through the measurement of anomalous Hall voltage, show stronger dependence on the Ta thickness relative to the similar structure with bottom Ta layer. The main effect may be interpreted by a current induced field-like-torque. We will discuss the quantitative critical current density as a function of Ta thickness and also explain why the top Ta layer introduces different effect relative to the bottom Ta layers. Chern Gung 陳恭 2014 學位論文 ; thesis 69 zh-TW
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language zh-TW
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description 碩士 === 國立中正大學 === 物理學系暨研究所 === 102 === The current-induced switching (CIS) in perpendicular magnetic thin layers and tunnel junctions has recently attracted lots of attention due to the possibility to achieve higher density magnetic random access magnetic memory(MRAM). However, the mechanism of the CIS and the materials dependence is still not clear. In this thesis, we fabricated a series of perpendicular magnetized MgO/CoFeB(1.3 nm)/Ta Hall bar structures with Ta thickness = 1, 1.25, and 5 nm, respectively. We found that the magnetic switching, through the measurement of anomalous Hall voltage, show stronger dependence on the Ta thickness relative to the similar structure with bottom Ta layer. The main effect may be interpreted by a current induced field-like-torque. We will discuss the quantitative critical current density as a function of Ta thickness and also explain why the top Ta layer introduces different effect relative to the bottom Ta layers.
author2 Chern Gung
author_facet Chern Gung
Tzeng Wei Han
曾威翰
author Tzeng Wei Han
曾威翰
spellingShingle Tzeng Wei Han
曾威翰
Current-Induced Magnetization Switching in Perpendicularly Anisotropy MagnetizedMgO/CoFeB/Ta
author_sort Tzeng Wei Han
title Current-Induced Magnetization Switching in Perpendicularly Anisotropy MagnetizedMgO/CoFeB/Ta
title_short Current-Induced Magnetization Switching in Perpendicularly Anisotropy MagnetizedMgO/CoFeB/Ta
title_full Current-Induced Magnetization Switching in Perpendicularly Anisotropy MagnetizedMgO/CoFeB/Ta
title_fullStr Current-Induced Magnetization Switching in Perpendicularly Anisotropy MagnetizedMgO/CoFeB/Ta
title_full_unstemmed Current-Induced Magnetization Switching in Perpendicularly Anisotropy MagnetizedMgO/CoFeB/Ta
title_sort current-induced magnetization switching in perpendicularly anisotropy magnetizedmgo/cofeb/ta
publishDate 2014
url http://ndltd.ncl.edu.tw/handle/72521932516986474780
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