Power-Aware Multi-Chains Encoding Scheme for Low-Cost Environment
博士 === 淡江大學 === 電機工程學系博士班 === 101 === As test data volumes continue to grow, test costs also increase. To lower test costs, this paper presents a new compression method for testing large circuits, based on multiple scan-chains and an unknown structure. This method is targeted at intellectual prope...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/07521281287039050345 |