The Practical Research of Battery Protection Integrated Circuit Testing System

• Main Authors: Chien-Ying Chu, 朱劍英
• Other Authors: 黃育賢
• Format: Others
• Language: zh-TW
• Published: 2013
• Online Access: http://ndltd.ncl.edu.tw/handle/rju8p9

碩士 === 國立臺北科技大學 === 電資碩士班 === 101 === In recent years, the analog power semiconductor development companies are required to face some basic questions, like faster product development and enhancement of the investment profit. Otherwise, there are some challenges, such as how to reduce the cost of semiconductor test, shorten development time and improve the verification accuracy. Therefore, industry adopts ATE (Automatic Test Equipment) the professional semiconductor testing system platform to develop the IC test engineering. The semiconductor test engineering in the semiconductor manufacturing process belongs to the back-end project phase, but this phase is important for yield rate and quality. It can reduce the packaging costs and make sure that the products conform to the specifications of the client. This thesis uses ASL1000 test machine with battery protection IC products to discuss the IC function test and the test development process, including basic DC test detection time, overcharge detection voltage and critical values of input impedance test, and test validation of input and output current design. This thesis includes the design and development case, interpreting the development of the test program, the design and the implementation of the load circuit board and the DUT circuit board, and the related considerations. At last, we draft the test plan, accomplish and verify the test engineering.