Dual Laser Triangulation Method Applied on the Petal Thickness Measurement

• Main Authors: Jiun-Shiang Yang, 楊竣翔
• Other Authors: 李廣齊
• Format: Others
• Language: zh-TW
• Published: 2013
• Online Access: http://ndltd.ncl.edu.tw/handle/yc3ycj

碩士 === 國立虎尾科技大學 === 自動化工程研究所 === 101 === The growth and health status of plants can be evaluated by their petal or leaves thickness. However, their thickness is difficult to be measured, since the irregular curvature of the petal or leaf surface and their soft nature. The petal surface will be damaged easily as we use the traditional contact mechanical apparatus to measure it. In this research we developed a novel non-contact and non-destructive dual laser triangulation measuring device for petal thickness based on the Scheimpflug''s principle. A cubic spline method was employed to curve fit the multi-points of petal surface after dual laser triangulation module measuring. The actual petal thickness can be calculated precisely from the normal equations of curvatures of petal surface. The measuring range and the resolution of the petal thickness measuring device were +/-2mm and 2um/pixel, respectively. The totally measurement uncertainty (includes the measuring repeatability, different surface slopes and colors) of the dual laser triangulation system was smaller than 16um. For the case of Phalaenopsis, different compensations were made according to different surface curvatures of petal.