Investigate the electronic and atomic structures of nonpolar a-plane GaN thin films

碩士 === 國立高雄大學 === 應用物理學系碩士班 === 101 === This study implemented a combination of atomic force microscope (AFM), X-ray diffraction pattern (XRD), Raman spectroscopy, and X-ay absorption near-edge structure (XANES) spectroscopy to investigate the relationship between the luminant properties, crystallog...

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Bibliographic Details
Main Authors: Yi-Cheng Hsieh, 謝一正
Other Authors: Jau-Wern Chiou
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/58516036018379534256