Structure Design of Lateral Insulated-Gate Power Transistors
碩士 === 國立臺灣科技大學 === 電子工程系 === 101 === In this thesis, a new lateral insulated-gate power device has been proposed. The structure design includes bulk-type and SOI-type. The simulation results show that this device achieves a larger on-current than both the power MOSFET and the TFET. The reason is th...
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ndltd-TW-101NTUS54281322016-03-21T04:28:02Z http://ndltd.ncl.edu.tw/handle/80072502603439802453 Structure Design of Lateral Insulated-Gate Power Transistors 橫向絕緣閘極功率電晶體之結構設計 Ming-Yang Lo 羅明揚 碩士 國立臺灣科技大學 電子工程系 101 In this thesis, a new lateral insulated-gate power device has been proposed. The structure design includes bulk-type and SOI-type. The simulation results show that this device achieves a larger on-current than both the power MOSFET and the TFET. The reason is the large series resistance in the drift region can be effectively alleviated by turning on the p+-anode/n-drfit junction of the device. On the other hand, the relationship between the electric characteristics of the device and the gate-position has been discussed. For improving the on-current of the devices, the band-to-band tunneling near the p-well/n-drift junction or the electric field of drift region must be increased. Both the above conditions can be controlled by shifting gate-position, and there is a trade-off between the efficiency of band-to-band tunneling and the electric field of drift region. As a result, a proper gate-position should be employed to optimize the electric characteristics of the devices. Miin-Horng Juang 莊敏宏 2013 學位論文 ; thesis 84 en_US |
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碩士 === 國立臺灣科技大學 === 電子工程系 === 101 === In this thesis, a new lateral insulated-gate power device has been proposed. The structure design includes bulk-type and SOI-type. The simulation results show that this device achieves a larger on-current than both the power MOSFET and the TFET. The reason is the large series resistance in the drift region can be effectively alleviated by turning on the p+-anode/n-drfit junction of the device.
On the other hand, the relationship between the electric characteristics of the device and the gate-position has been discussed. For improving the on-current of the devices, the band-to-band tunneling near the p-well/n-drift junction or the electric field of drift region must be increased. Both the above conditions can be controlled by shifting gate-position, and there is a trade-off between the efficiency of band-to-band tunneling and the electric field of drift region. As a result, a proper gate-position should be employed to optimize the electric characteristics of the devices.
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author2 |
Miin-Horng Juang |
author_facet |
Miin-Horng Juang Ming-Yang Lo 羅明揚 |
author |
Ming-Yang Lo 羅明揚 |
spellingShingle |
Ming-Yang Lo 羅明揚 Structure Design of Lateral Insulated-Gate Power Transistors |
author_sort |
Ming-Yang Lo |
title |
Structure Design of Lateral Insulated-Gate Power Transistors |
title_short |
Structure Design of Lateral Insulated-Gate Power Transistors |
title_full |
Structure Design of Lateral Insulated-Gate Power Transistors |
title_fullStr |
Structure Design of Lateral Insulated-Gate Power Transistors |
title_full_unstemmed |
Structure Design of Lateral Insulated-Gate Power Transistors |
title_sort |
structure design of lateral insulated-gate power transistors |
publishDate |
2013 |
url |
http://ndltd.ncl.edu.tw/handle/80072502603439802453 |
work_keys_str_mv |
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1718209738120888320 |