The influence of nano-patterned sapphire substrate in InGaN-based light emitting diodes
碩士 === 國立臺灣大學 === 電子工程學研究所 === 101 === Growth of GaN-based light-emitting diodes on sapphire substrates , because of the differences between the lattice constant and thermal expansion coefficient , resulting in Quantum-Confined Stark Effect , reducing the LEDs efficiency. Therefore, this paper would...
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ndltd-TW-101NTU054280792015-10-13T23:05:29Z http://ndltd.ncl.edu.tw/handle/00096059004548107828 The influence of nano-patterned sapphire substrate in InGaN-based light emitting diodes 圖案化藍寶石基板對發光二極體之影響 Po-Hsun Chen 陳柏勳 碩士 國立臺灣大學 電子工程學研究所 101 Growth of GaN-based light-emitting diodes on sapphire substrates , because of the differences between the lattice constant and thermal expansion coefficient , resulting in Quantum-Confined Stark Effect , reducing the LEDs efficiency. Therefore, this paper would like to be contacted by the production of nano-patterned sapphire substrates to explore on the GaN light emitting diodes impacts. I use e-beam lithography system with wet etching techniques to produce different periods, different substrate ratio nanostructures and use of metal organic chemical vapor deposition system for GaN epitaxy . Subsequently confirmed using Raman spectroscopy system to exam epitaxial quality, photoluminescence (PL) system active layer photoluminescence measurements, the last measurement using cryogenic system internal quantum efficiency. 管傑雄 2013 學位論文 ; thesis 60 zh-TW |
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碩士 === 國立臺灣大學 === 電子工程學研究所 === 101 === Growth of GaN-based light-emitting diodes on sapphire substrates , because of the differences between the lattice constant and thermal expansion coefficient , resulting in Quantum-Confined Stark Effect , reducing the LEDs efficiency. Therefore, this paper would like to be contacted by the production of nano-patterned sapphire substrates to explore on the GaN light emitting diodes impacts. I use e-beam lithography system with wet etching techniques to produce different periods, different substrate ratio nanostructures and use of metal organic chemical vapor deposition system for GaN epitaxy . Subsequently confirmed using Raman spectroscopy system to exam epitaxial quality, photoluminescence (PL) system active layer photoluminescence measurements, the last measurement using cryogenic system internal quantum efficiency.
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管傑雄 |
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管傑雄 Po-Hsun Chen 陳柏勳 |
author |
Po-Hsun Chen 陳柏勳 |
spellingShingle |
Po-Hsun Chen 陳柏勳 The influence of nano-patterned sapphire substrate in InGaN-based light emitting diodes |
author_sort |
Po-Hsun Chen |
title |
The influence of nano-patterned sapphire substrate in InGaN-based light emitting diodes |
title_short |
The influence of nano-patterned sapphire substrate in InGaN-based light emitting diodes |
title_full |
The influence of nano-patterned sapphire substrate in InGaN-based light emitting diodes |
title_fullStr |
The influence of nano-patterned sapphire substrate in InGaN-based light emitting diodes |
title_full_unstemmed |
The influence of nano-patterned sapphire substrate in InGaN-based light emitting diodes |
title_sort |
influence of nano-patterned sapphire substrate in ingan-based light emitting diodes |
publishDate |
2013 |
url |
http://ndltd.ncl.edu.tw/handle/00096059004548107828 |
work_keys_str_mv |
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