Lithography Optimization for Sub-22 Nanometer Technologies

博士 === 國立臺灣大學 === 電子工程學研究所 === 101 === As integrated circuit (IC) process nodes continue to shrink to 22nm and below, the IC industry will face severe manufacturing challenges with conventional optical lithography technologies. According to the keynote speech at International Symposium on Physical D...

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Bibliographic Details
Main Authors: Shao-Yun Fang, 方劭云
Other Authors: 張耀文
Format: Others
Language:en_US
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/91452054312255317999