Investigation on Characteristics and Degradation Behaviors of Integrated High-Voltage MOSFET Transistors
博士 === 國立清華大學 === 電子工程研究所 === 101 === Abstract With the evolution of Moore’s law in CMOS technologies, the demands of high-voltage MOSFET transistors (HVMOS) are also rapidly increasing for the diversifications and functionalities in modern electronic product. For the reason, a 0.18μm BCD platform i...
Main Authors: | Chou, Hsueh-Liang, 周學良 |
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Other Authors: | Gong, Jeng |
Format: | Others |
Language: | en_US |
Published: |
2013
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Online Access: | http://ndltd.ncl.edu.tw/handle/13937491360209463823 |
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