Study on Template Matching of Microscopic Image at Wafer Level

碩士 === 國立清華大學 === 動力機械工程學系 === 101 === The research is focused on the topic of template matching with microscopic image at wafer level by image processing methods. Due to the occurrence of defect in the wafer, the template and the sample wafer-level microscopic image might be different. Among existi...

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Bibliographic Details
Main Authors: Pan, Yi-Chi, 潘奕奇
Other Authors: Tsai, Hung-Yin
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/12454159294593751462

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