Three-dimensional topography measurement for transparent object with specific profile by Phase shifting Differential Interference Contrast Microscopy (PS-DIC)
碩士 === 國立清華大學 === 動力機械工程學系 === 101 === Due to the fact that opto-electronic products have become more and more popular in recent years, the demand for displays used in computer monitors, mobile phones, PDAs, digital cameras and tablet PCs has continued to increase significantly. General methods of m...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/67205709593505815603 |