The study of high k dielectrics and metal gates on Si and III-V semiconductor substrates for the advanced CMOS technology

博士 === 國立清華大學 === 材料科學工程學系 === 101 === Looking beyond the 15 nm node ICs, the consensus is that not only high-κ dielectrics but also appropriate channel material should replace the long-standing SiO2/Si system. The combination of high-κ dielectrics with channel of the III-Vs will have to be integrat...

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Bibliographic Details
Main Authors: Wu, Yan-Dar, 吳彥達
Other Authors: Huang, Tsung-Shiew
Format: Others
Language:en_US
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/87326659377380981542