Measurement of reflectance anisotropy spectroscopy of m-plane and c-plane zinc oxide semiconductor by using twisted nematic liquid crystals
碩士 === 國立中山大學 === 物理學系研究所 === 101 === Twisted nematic liquid crystals were used to measure reflectance anisotropy spectroscopy of m-plane and c-plane ZnO bulks. This experimental setup was based on Aspnes’s experimental setup in 1988 (D. E. Aspnes, J. P. Harbison, A. A. Studna and L. T. Florez, Appl...
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2013
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ndltd-TW-101NSYS51980242019-05-15T21:02:51Z http://ndltd.ncl.edu.tw/handle/g4p8xy Measurement of reflectance anisotropy spectroscopy of m-plane and c-plane zinc oxide semiconductor by using twisted nematic liquid crystals 使用扭轉向列型液晶測量氧化鋅m平面及c平面之反射異向性光譜 Hsien-Li Chen 陳咸利 碩士 國立中山大學 物理學系研究所 101 Twisted nematic liquid crystals were used to measure reflectance anisotropy spectroscopy of m-plane and c-plane ZnO bulks. This experimental setup was based on Aspnes’s experimental setup in 1988 (D. E. Aspnes, J. P. Harbison, A. A. Studna and L. T. Florez, Appl. Phys. Lett. 52, 957, 1988). Whether the ZnO samples were c-plane or m-plane oriented can be determined by using this measurement. Finally, the direction of c-axis of the m-plane sample can also be determined. Dong Po Wang 王東波 2013 學位論文 ; thesis 31 zh-TW |
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碩士 === 國立中山大學 === 物理學系研究所 === 101 === Twisted nematic liquid crystals were used to measure reflectance anisotropy spectroscopy of m-plane and c-plane ZnO bulks. This experimental setup was based on Aspnes’s experimental setup in 1988 (D. E. Aspnes, J. P. Harbison, A. A. Studna and L. T. Florez, Appl. Phys. Lett. 52, 957, 1988). Whether the ZnO samples were c-plane or m-plane oriented can be determined by using this measurement. Finally, the direction of c-axis of the m-plane sample can also be determined.
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Dong Po Wang |
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Dong Po Wang Hsien-Li Chen 陳咸利 |
| author |
Hsien-Li Chen 陳咸利 |
| spellingShingle |
Hsien-Li Chen 陳咸利 Measurement of reflectance anisotropy spectroscopy of m-plane and c-plane zinc oxide semiconductor by using twisted nematic liquid crystals |
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Hsien-Li Chen |
| title |
Measurement of reflectance anisotropy spectroscopy of m-plane and c-plane zinc oxide semiconductor by using twisted nematic liquid crystals |
| title_short |
Measurement of reflectance anisotropy spectroscopy of m-plane and c-plane zinc oxide semiconductor by using twisted nematic liquid crystals |
| title_full |
Measurement of reflectance anisotropy spectroscopy of m-plane and c-plane zinc oxide semiconductor by using twisted nematic liquid crystals |
| title_fullStr |
Measurement of reflectance anisotropy spectroscopy of m-plane and c-plane zinc oxide semiconductor by using twisted nematic liquid crystals |
| title_full_unstemmed |
Measurement of reflectance anisotropy spectroscopy of m-plane and c-plane zinc oxide semiconductor by using twisted nematic liquid crystals |
| title_sort |
measurement of reflectance anisotropy spectroscopy of m-plane and c-plane zinc oxide semiconductor by using twisted nematic liquid crystals |
| publishDate |
2013 |
| url |
http://ndltd.ncl.edu.tw/handle/g4p8xy |
| work_keys_str_mv |
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