Summary: | 碩士 === 國立屏東科技大學 === 環境工程與科學系所 === 101 === In order to characterize the size distributions of water-soluble ions and the compositions of metal elements in the atmospheric particles around a semiconductor plant, particle samples were collected in air pollution episode days, general sunny days, and sunny days after raining from March to September, 2011 on the roof of the semiconductor plant in southern Taiwan. The results showed that the accumulation percentages of PM0.056–2.5 water-soluble ions were 50−80% of 0.056~18 µm particles, and the accumulation percentages of SO42– and NH4+ were above 80% in all samples. The MMD (mass median diameter) of NO3– was higher than those of SO42– and NH4+. On air pollution episode and general sunny days, the accumulation percentages of Na+ and Mg2+ in the fine particles were about 20−30%, while those in sunny days after raining were 65.5% and 38.4%, respectively. The MMDs of main particulate metals (most were crustal elements) ranged from 1.34 to 5.24 m. The MMDs of Ti, Ni, Al, and Fe were in a coarse size range; however those of other metals were in a fine size range.
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