Photoluminescence in solar cell efficiency prediction in wafer procedure

• Main Authors: Yi-Yao Du, 杜羿嶢
• Other Authors: Te-Yuan Chung
• Format: Others
• Language: zh-TW
• Published: 2013
• Online Access: http://ndltd.ncl.edu.tw/handle/93589356185231628448

碩士 === 國立中央大學 === 照明與顯示科技研究所 === 101 === The article utilizes photoluminescence(PL) imaging technology and successfully links macroscopic and microscopic phenomena. Solar cell efficiency prediction in as-cut wafer process with the help of photoluminescence is obtained. The SSIM values of as-cut wafer PL image and after calculated to wet-clean PL image raise from 0.5461 to 0.6205. 357 pieces solar cell procedure are utilized to confirm the method in this article. Correlation of predicted efficiency in as-cut wafer process and real efficiency in solar cell process is 0.6762.