Internal defect detection using lock-in thermography
碩士 === 國立中央大學 === 光電科學與工程學系 === 101 === This research successfully builds a non-destructive, non-contact detection method of determining the internal defect depth and defect radius in samples. In lock-in thermography method, the samples are measured by periodically changed heat flux. The effect abou...
Main Authors: | Tsan-nien Chen, 陳贊年 |
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Other Authors: | Te-yuan Chung |
Format: | Others |
Language: | zh-TW |
Published: |
2013
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Online Access: | http://ndltd.ncl.edu.tw/handle/45457800827895975325 |
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