Internal defect detection using lock-in thermography

碩士 === 國立中央大學 === 光電科學與工程學系 === 101 === This research successfully builds a non-destructive, non-contact detection method of determining the internal defect depth and defect radius in samples. In lock-in thermography method, the samples are measured by periodically changed heat flux. The effect abou...

Full description

Bibliographic Details
Main Authors: Tsan-nien Chen, 陳贊年
Other Authors: Te-yuan Chung
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/45457800827895975325