Thermal stability of supersaturated carbon incorporation in silicon

碩士 === 國立中央大學 === 物理學系 === 101 === Due to large size mismatch between carbon (C) and silicon (Si), silicon carbon alloy (Si:C) is used as the stressors in the source and drain (S/D) of n-type metal-oxide-semiconductor field effect transistor (n-MOSFET) to improve the electron mobility. In addition,...

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Bibliographic Details
Main Authors: Yu-ting Lin, 林侑鋌
Other Authors: Wei-yen Woon
Format: Others
Language:en_US
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/2mjhfa

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