Constructing the automation system unit testing process for the wafer start system – A case study of A company

• Main Authors: Chen, Huei-Shan, 陳慧珊
• Other Authors: Li, Yung-Ming
• Format: Others
• Language: zh-TW
• Published: 2013
• Online Access: http://ndltd.ncl.edu.tw/handle/s3x7cv

碩士 === 國立交通大學 === 管理學院資訊管理學程 === 101 === Software testing is an important term in the information growing epoch, which can help us to reduce the risk of system security. Therefore, this research is a case study based on the wafer start system of A Company. The purpose is actually to construct an automation test process based on unit test phase to imporve the inconvenience during manual testing. In addition to implementing and discussing for unit test, we also do the performance evaluation. This research plans to apply and improve the concept of Heuristic Test Strategy Model (HTSM) to implement the high coverage test case for different case systems. Focusing on system units and through the test design pattern specification, we use test development tools to help develop the unit test automation process that is reusable. For benefit evaluation analysis, we will analyze four performance indices that include "Coverage", "Efficiency", "Cost", and “Accuracy". As found in the final results of the assessment, the overall coverage, efficiency, and accuracy are significantly improved, and cost can also be observed to be decreased.