Gate driver designs for AlGaN/GaN HEMT power transistors

碩士 === 國立交通大學 === 機械工程系所 === 101 === This thesis proposed a proper and complete high/low side gate drive circuit for GaN transistors. Unlike the conventional enhancement mode driver, this circuit designed for the depletion mode transistors, providing a negative gate-source voltage to turn off the po...

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Main Authors: Wu, Cheng-Kuan, 吳政寬
Other Authors: Chen, Tsung-Lin
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/05310759783398313940
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spelling ndltd-TW-101NCTU54890482015-10-13T23:10:50Z http://ndltd.ncl.edu.tw/handle/05310759783398313940 Gate driver designs for AlGaN/GaN HEMT power transistors AlGaN/GaN HEMT功率電晶體驅動電路設計 Wu, Cheng-Kuan 吳政寬 碩士 國立交通大學 機械工程系所 101 This thesis proposed a proper and complete high/low side gate drive circuit for GaN transistors. Unlike the conventional enhancement mode driver, this circuit designed for the depletion mode transistors, providing a negative gate-source voltage to turn off the power transistors. In the high side drive circuit, we design: 1. bootstrap high side circuit. 2. Needless high breakdown voltage element two kind of configuration to drive GaN/AlGaN transistors. The first method, we used a bootstrap circuit to provide a stable gate-source voltage for the power devices, and then transferred the logic signals into the appropriate control signals by the level shifter. In order to maintain high efficiency and reduce the power consumption of this circuit, the study designed a latch circuit, which combined with the level shifter to decrease the operating time. For the bootstrap capacitor charging problem, which was due to the “normally-on” property of the depletion mode transistor, the study also designed a start-up circuit to control the timing of the initial activation of the devices. Therefore, the bootstrap capacitor would have enough lead time to charge. The second method, we used two of capacitors to endure the high voltage from others elements. Therefore, the relative transistors in this circuit would not sustain high voltage. In general, high breakdown voltage elements need a special process. The special process is necessary in this configuration, so we can reduce the cost IC produce. Both gate driver circuits are designed and simulated using HSPICE, and then verified by experimental results. In the first gate driver design, the experimental results show that it can work at 48V/100kHz.. In the second gate driver design, the GaN transistors can work at condition 24V/1kHz. Finally, we complete the circuit layout and apply for D35 process from CIC. Chen, Tsung-Lin 陳宗麟 2013 學位論文 ; thesis 62 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立交通大學 === 機械工程系所 === 101 === This thesis proposed a proper and complete high/low side gate drive circuit for GaN transistors. Unlike the conventional enhancement mode driver, this circuit designed for the depletion mode transistors, providing a negative gate-source voltage to turn off the power transistors. In the high side drive circuit, we design: 1. bootstrap high side circuit. 2. Needless high breakdown voltage element two kind of configuration to drive GaN/AlGaN transistors. The first method, we used a bootstrap circuit to provide a stable gate-source voltage for the power devices, and then transferred the logic signals into the appropriate control signals by the level shifter. In order to maintain high efficiency and reduce the power consumption of this circuit, the study designed a latch circuit, which combined with the level shifter to decrease the operating time. For the bootstrap capacitor charging problem, which was due to the “normally-on” property of the depletion mode transistor, the study also designed a start-up circuit to control the timing of the initial activation of the devices. Therefore, the bootstrap capacitor would have enough lead time to charge. The second method, we used two of capacitors to endure the high voltage from others elements. Therefore, the relative transistors in this circuit would not sustain high voltage. In general, high breakdown voltage elements need a special process. The special process is necessary in this configuration, so we can reduce the cost IC produce. Both gate driver circuits are designed and simulated using HSPICE, and then verified by experimental results. In the first gate driver design, the experimental results show that it can work at 48V/100kHz.. In the second gate driver design, the GaN transistors can work at condition 24V/1kHz. Finally, we complete the circuit layout and apply for D35 process from CIC.
author2 Chen, Tsung-Lin
author_facet Chen, Tsung-Lin
Wu, Cheng-Kuan
吳政寬
author Wu, Cheng-Kuan
吳政寬
spellingShingle Wu, Cheng-Kuan
吳政寬
Gate driver designs for AlGaN/GaN HEMT power transistors
author_sort Wu, Cheng-Kuan
title Gate driver designs for AlGaN/GaN HEMT power transistors
title_short Gate driver designs for AlGaN/GaN HEMT power transistors
title_full Gate driver designs for AlGaN/GaN HEMT power transistors
title_fullStr Gate driver designs for AlGaN/GaN HEMT power transistors
title_full_unstemmed Gate driver designs for AlGaN/GaN HEMT power transistors
title_sort gate driver designs for algan/gan hemt power transistors
publishDate 2013
url http://ndltd.ncl.edu.tw/handle/05310759783398313940
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AT wúzhèngkuān alganganhemtgōnglǜdiànjīngtǐqūdòngdiànlùshèjì
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