| Summary: | 碩士 === 國立交通大學 === 電子物理系所 === 101 === In our research, we use deconvolution microscopy system to obtain sample signal which is closer to the original sample morphology and non-diffraction limited in the maintenance of microscope optical system. The principle of deconvolution microscopy is consider microscopy image as a convolution result of point spread function (PSF) and sample signal. In the case of known sample signals, PSF can be obtained by deconvolution algorithm. In this experiment, we used two method to define PSF of microscope optical system. First we bring PSF into expectation–maximization algorithm and maximum-likelihood estimation(EM-MLE) after derivation the actual sample signal can be obtained. The second method is directly use the microscope image of the sample which is less than the diffraction limit as PSF. Result shows that not only morphology but also algorithmic speed used in the first method are both superior to the second method. Finally, we use computer simulation to confirm the result of the difference really dependent on two method we use to obtain the sample signal. In addition, in our research also find out the noise in our system can be describe as Poisson noise and further discuss the influence to the deconvolution microscopy.
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