Fabrication of silver inverse opals for structural characterization by transmission X-ray microscopy

• Main Authors: Huang, Bo-Han, 黃柏翰
• Other Authors: Wu, Pu-Wei
• Format: Others
• Language: zh-TW
• Published: 2013
• Online Access: http://ndltd.ncl.edu.tw/handle/34186730022387366097

碩士 === 國立交通大學 === 工學院加速器光源科技與應用碩士學位學程 === 101 === We employ an electrophoresis process to prepare colloidal crystals in a planar form (basing on polystyrene (PS) microspheres of 450±50 nm in diameter) with superb surface uniformity. Subsequently, the colloidal crystal is served as a template to allow for the electroplating of silver into the interstitial voids among the PS microspheres, followed by the removal of the PS microspheres to obtain a porous silver skeleton at controlled layers/thickness. Next, the structural characteristics of the sample are determined by a transmission X-ray microscopy (TXM). The TXM is a powerful tool to obtain two-dimensional and three-dimensional images, as well as the composition profiles at nanometer resolution by illuminating the sample with intense X-ray photons and record any variation in the resulting transmittance from two-dimensional incident angle of 150°. The three-dimensional image is reconstructed via a mathematic algorithm combining various two-dimensional image contrasts. We demonstrate that the TXM can be used to determine relevant crystallographic information including defects, grain size, grain boundary, grain orientation and stacking sequence of the assembled PS microspheres.