| Summary: | 碩士 === 國立交通大學 === 管理學院工業工程與管理學程 === 101 === Due to the serious competition of the international market, requirements of product /process quality from customers are increasing rapidly. Consequently, on the precise measuring system to ensure the product/process quality depends the Semiconductor manufactories which particularly needs precise visual inspection to ensure their product quality, therefore evaluating the agreement among inspectors, This study develops a procedure of assessing the attribute agreement of inspectors using Kappa becomes important analysis method. Finally, a case of IC testing house in Hsin-chu, Taiwan is utilized to demonstrate the effectiveness of the proposed method. The result of this study can be utilized by Semiconductor manufactories to assess their inspectors’ skills. it can also be employed as risk management. In addition, the results of this study can be utilized to reduce the quality lost of a process and to develop a useful method of improving inspector’s skills.
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