Epitaxial Growth and Structural Characterization of Single Crystalline Bi2Te3/Bi2Se3 Topological Insulator Multilayer
碩士 === 國立成功大學 === 物理學系碩博士班 === 101 === Bi2Te3/Bi2Se3 topological insulator multilayers have been successfully established on Al2O3 (0001) substrates by molecular beam epitaxy (MBE). In-situ reflection high energy electron diffraction (RHEED) and ex-situ atomic force microscopy (AFM) indicate the smo...
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| Format: | Others |
| Language: | en_US |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/88022157468971825629 |