The Structures and Magnetic Properties of Ta/Co/CoO/SiO2 Thin Films

• Main Authors: Chi-chun Wang, 王基駿
• Other Authors: Ko-Wei
• Format: Others
• Language: zh-TW
• Published: 2013
• Online Access: http://ndltd.ncl.edu.tw/handle/6zk2jr

碩士 === 國立中興大學 === 材料科學與工程學系所 === 101 === The composite films of Ta/Co/CoO on Si substrate was prepared by dual ion-beam deposition technique. The structural and magnetic properties of the composite films were studied by X-ray diffraction(XRD),transmission electron microscopy(TEM), Vibrating sample magnetometer(VSM),respectively. XRD results have shown that Ta layer consisted of B.C.C. with a＝3.31 A, Co layer consisted of H.C.P. with a＝2.51A,c＝4.05A, and CoO layer consisted of F.C.C. with a＝4.27A.TEM results have shown that the grain size of polycrystalline composite films range from 5 to16nm. Magnetic properties at room temperature (298K) and magnetic field along the parallel and perpendicular to the film surface have been measured,and the results showed that the easy axis of specimen is in-plane.In addition, Ta/Co/CoO film exhibits no exchange bias field (Hc～6.8 Oe) at room temperature, but at 180K,the temperature below the antiferromagnetic Neel temperature (Co～290K),a slightly increased exchange bias field (Hex~ 3.6 Oe) was observed.