The Effects of Applied Strains on the Ag/Sn Interfacial Reactions
碩士 === 國立中興大學 === 化學工程學系所 === 101 === Damages on material are unavoidable in the production process and application of electronic device. One of these damages is mechanical strain which is resulted from the difference between the coefficients of thermal expansion (CTE) of materials. It may affect...
Main Authors: | Yu-Ju Tseng, 曾玉如 |
---|---|
Other Authors: | Chih-Ming Chen |
Format: | Others |
Language: | zh-TW |
Published: |
2013
|
Online Access: | http://ndltd.ncl.edu.tw/handle/e6garw |
Similar Items
-
Effects of Minor Co Addition upon Sn-Cu/Ag, Sn-Cu/Ni,and Sn-Cu/Cu Interfacial Reactions
by: Yan-Lun Tseng, et al.
Published: (2013) -
Effect of different SnAg thickness on interfacial reactions in microbumps of Ni/SnAg/Cu
by: Chang, Chao-Chun, et al.
Published: (2011) -
The effects of strain on Ni/Sn interfacial reactions
by: Wen-Kai Liao, et al.
Published: (2011) -
Interfacial reactions in Sn/V、Sn-Ag/V、Sn/(Ni,V) and Sn-Ag/ (Ni,V) systems
by: Ching-ya Kao, et al.
Published: (2004) -
Phase Equilibria of the ternary Ag-Sn-Cu and Ag-Sn-Au systems, and interfacial reactions in Ag-Sn/Cu and Ag-Sn/Au couples
by: Yen, Yee-wen, et al.
Published: (2002)